![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE OPTO: Integrated Optoelectronic Devices - San Jose, CA (Saturday 24 January 2009)] Silicon Photonics IV - Identifying resonance frequency deviations for high order nano-wire ring resonator filters based on a coupling strength variation
Park, Sahnggi, Kubby, Joel A., Reed, Graham T., Kim, Kap-Joong, Kim, Duk-Jun, Kim, GyungockVolume:
7220
Year:
2009
Language:
english
DOI:
10.1117/12.808868
File:
PDF, 786 KB
english, 2009