SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Jose, CA (Sunday 18 January 2009)] Wavelet Applications in Industrial Processing VI - Image segmentation on cell-center sampled quadtree and octree grids
Kim, Byungmoon, Truchetet, Frederic, Laligant, Olivier, Tsiotras, PanagiotisVolume:
7248
Year:
2009
Language:
english
DOI:
10.1117/12.810965
File:
PDF, 1.28 MB
english, 2009