SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida, USA (Monday 13 April 2009)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XX - Comparison of emissivity evaluation methods for infrared sources
Scopatz, Stephen D., Holst, Gerald C., Mazzetta, Jason A., Sgheiza, John E., Medina, Miguel A.Volume:
7300
Year:
2009
Language:
english
DOI:
10.1117/12.818217
File:
PDF, 450 KB
english, 2009