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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Polarization Science and Remote Sensing IV - Evaluation of the polarization properties of a Philips-type prism for the construction of imaging polarimeters
Fernandez-Borda, R., Shaw, Joseph A., Tyo, J. Scott, Waluschka, E., Pellicori, S., Martins, J. V., Ramos-Izquierdo, L., Cieslak, J. D., Thompson, P.Volume:
7461
Year:
2009
Language:
english
DOI:
10.1117/12.829080
File:
PDF, 1.16 MB
english, 2009