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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - The dynamic interferometry technology of 4.5-meter concave aspherical mirror and relativity precision analysis
Wang, Zhao, Ye, Shenghua, Zhang, Guangjun, Zhang, Wei, Ren, Zhi-bin, Ni, JunVolume:
7511
Year:
2009
Language:
english
DOI:
10.1117/12.835988
File:
PDF, 300 KB
english, 2009