![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Identification of oil spills by near-infrared spectroscopy (NIR) and support vector machine (SVM)
Bi, Weihong, Ye, Shenghua, Zhang, Guangjun, Tan, Ailing, Zhao, Yong, Ni, Jun, Gao, MeijingVolume:
7511
Year:
2009
Language:
english
DOI:
10.1117/12.838054
File:
PDF, 567 KB
english, 2009