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SPIE Proceedings [SPIE International Conference on Experimental Mechnics 2008 and Seventh Asian Conference on Experimental Mechanics - Nanjing, China (Saturday 8 November 2008)] ICEM 2008: International Conference on Experimental Mechanics 2008 - Validation and reliability assessment of board level drop test of chip-scale-packaging

Hung, Tuan-Yu, He, Xiaoyuan, Xie, Huimin, Chou, Chan-Yen, Yew, Ming-Chih, Kang, YiLan, Chiang, Kuo-Ning
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Volume:
7375
Year:
2008
Language:
english
DOI:
10.1117/12.839037
File:
PDF, 862 KB
english, 2008
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