SPIE Proceedings [SPIE Scanning Microscopy 2010 - Monterey, California (Monday 17 May 2010)] Scanning Microscopy 2010 - The influence of surface chemistry on GSR particles: using XPS to complement SEM/EDS analytical techniques
Postek, Michael T., Schwoeble, A. J., Strohmeier, Brian R., Newbury, Dale E., Platek, S. Frank, Piasecki, John D., Joy, David C.Volume:
7729
Year:
2010
Language:
english
DOI:
10.1117/12.863906
File:
PDF, 3.29 MB
english, 2010