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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Novel sub-pixel feature point extracting algorithm for three-dimensional measurement system with linear-structure light
Zhang, Weiguang, Zhang, Yudong, Sasián, José, Cao, Nan, Guo, Haiyan, Xiang, Libin, To, SandyVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.864563
File:
PDF, 598 KB
english, 2010