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SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - 3D profile measurement by using projection speckle pattern correlation method
Hu, Eryi, Harding, Kevin, Huang, Peisen S., Zhu, Lixia, Yoshizawa, ToruVolume:
7855
Year:
2010
Language:
english
DOI:
10.1117/12.868510
File:
PDF, 996 KB
english, 2010