SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil...

  • Main
  • SPIE Proceedings [SPIE Speckle 2010 -...

SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil (Monday 13 September 2010)] Speckle 2010: Optical Metrology - Speckle reduction in line-scan laser projectors using binary phase codes: theory and experiments

Akram, M. Nadeem, Albertazzi Goncalves, Jr., Armando, Kaufmann, Guillermo H., Ouyang, Guangmin, Gao, Wenhong, Tong, Zhaomin, Chen, Xuyuan Y.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
7387
Year:
2010
Language:
english
DOI:
10.1117/12.869420
File:
PDF, 550 KB
english, 2010
Conversion to is in progress
Conversion to is failed