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SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil (Monday 13 September 2010)] Speckle 2010: Optical Metrology - Speckle reduction in line-scan laser projectors using binary phase codes: theory and experiments
Akram, M. Nadeem, Albertazzi Goncalves, Jr., Armando, Kaufmann, Guillermo H., Ouyang, Guangmin, Gao, Wenhong, Tong, Zhaomin, Chen, Xuyuan Y.Volume:
7387
Year:
2010
Language:
english
DOI:
10.1117/12.869420
File:
PDF, 550 KB
english, 2010