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SPIE Proceedings [SPIE International Conference on Image Processing and Pattern Recognition in Industrial Engineering - Xi'an, China (Saturday 7 August 2010)] International Conference on Image Processing and Pattern Recognition in Industrial Engineering - Front Matter: Volume 7820
SPIE, Proceedings of, Du, Zhengyu, Liu, BinVolume:
7820
Year:
2010
Language:
english
DOI:
10.1117/12.870032
File:
PDF, 270 KB
english, 2010