SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2011 - Beijing, China (Tuesday 24 May 2011)] International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications - Integrated solution for high resolution CCD camera imaging circuits
Bai, Zhe, Xu, Yanbing, Zhang, Boheng, Duan, KailiangVolume:
8194
Year:
2012
Language:
english
DOI:
10.1117/12.901001
File:
PDF, 342 KB
english, 2012