![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Interferometry XVI: Applications - Point diffraction interferometer for measurement of the refraction index of a glass plate
Rueda-Soriano, E., Granados-Agustín, F. S., Cornejo-Rodríguez, A., Percino-Zacarías, Elizabeth, Cebrian-Xochihuila, P., Canales Pacheco, B., Furlong, Cosme, Gorecki, Christophe, Novak, Erik L.Volume:
8494
Year:
2012
Language:
english
DOI:
10.1117/12.928889
File:
PDF, 1.15 MB
english, 2012