SPIE Proceedings [SPIE Robotics and IECON '87 Conferences - Cambridge, CA (Monday 2 November 1987)] IECON '87: Industrial Applications of Robotics & Machine Vision - Color Quality Inspection Of Imaging Device
Asano, Toshio, Hata, Seiji, Koishikawa, Susumu, Shimizu, Youichi, Abramovich, AbeVolume:
856
Year:
1987
Language:
english
DOI:
10.1117/12.943029
File:
PDF, 1.78 MB
english, 1987