SPIE Proceedings [SPIE 1985 Technical Symposium East -...

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SPIE Proceedings [SPIE 1985 Technical Symposium East - Arlington (Wednesday 10 April 1985)] Image Quality: An Overview - Resolution Requirements For Binarization Of Line Art

Bilotta, Thomas J., Lumia, John J., Baker, Lionel R., Granger, Edward M.
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Volume:
549
Year:
1985
Language:
english
DOI:
10.1117/12.948805
File:
PDF, 1.82 MB
english, 1985
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