SPIE Proceedings [SPIE 1985 Technical Symposium East - Arlington (Wednesday 10 April 1985)] Image Quality: An Overview - Resolution Requirements For Binarization Of Line Art
Bilotta, Thomas J., Lumia, John J., Baker, Lionel R., Granger, Edward M.Volume:
549
Year:
1985
Language:
english
DOI:
10.1117/12.948805
File:
PDF, 1.82 MB
english, 1985