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SPIE Proceedings [SPIE 1988 Intl Congress on Optical Science and Engineering - Hamburg, Germany (Monday 19 September 1988)] Surface Measurement and Characterization - Statistical Analysis Of Random And Pseudo Random Rough Surfaces
Rasigni, Monique, Rasigni, Georges, Varnier, Francoise, Dussert, Christophe, Palmari, Jacqueline, Mayani, Nicole, Llebaria, Antoine, Bennett, Jean M.Volume:
1009
Year:
1989
Language:
english
DOI:
10.1117/12.949157
File:
PDF, 8.67 MB
english, 1989