SPIE Proceedings [SPIE O-E/Fiber LASE '88 - Boston, MA (Tuesday 6 September 1988)] Integrated Optical Circuit Engineering VI - High Accuracy Determination Of Semiconductor Substrate And Waveguide Refractive Index By Prism Coupling
Morasca, S., De Bernardi, C., Mentzer, Mark A.Volume:
993
Year:
1988
Language:
english
DOI:
10.1117/12.960084
File:
PDF, 143 KB
english, 1988