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SPIE Proceedings [SPIE Hague International Symposium - The Hague, Netherlands (Monday 30 March 1987)] In-Process Optical Metrology for Precision Machining - In-Process Metrology And Control Of Large Optical Grinders
Anderson, D. S., Ketelsen, D., Kittrell, W. Cary, Kuhn, Wm, Parks, R. E., Stahl, P., Langenbeck, PeterVolume:
802
Year:
1987
Language:
english
DOI:
10.1117/12.967108
File:
PDF, 8.69 MB
english, 1987