![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - CCD photoresponse calibration and contrast adjustment for reliable material discrimination in the inspection of electronic packages
Ford, Ralph M., Kerstens, Pieter J. M., Dorundo, Alan D., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.Volume:
1661
Year:
1992
Language:
english
DOI:
10.1117/12.130303
File:
PDF, 647 KB
english, 1992