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SPIE Proceedings [SPIE International Symposium on Optical Fabrication, Testing, and Surface Evaluation - Tokyo, Japan (Wednesday 10 June 1992)] Intl Symp on Optical Fabrication, Testing, and Surface Evaluation - Measurement of large-scale and high-precision optics using a noncontact form-measuring probe
Murai, Seiichiro, Ueda, Katsunobu, Sakuta, Shigeru, Ishikawa, Ken, Tsujiuchi, JumpeiVolume:
1720
Year:
1992
Language:
english
DOI:
10.1117/12.132107
File:
PDF, 321 KB
english, 1992