SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Machine Vision Applications, Architectures, and Systems Integration III - Development of a high-speed single inline memory module (SIMM) connector inspection system
Mahon, James, O'Neill, Sean, Batchelor, Bruce G., Solomon, Susan S., Waltz, Frederick M.Volume:
2347
Year:
1994
Language:
english
DOI:
10.1117/12.188743
File:
PDF, 278 KB
english, 1994