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SPIE Proceedings [SPIE 23 Annual AIPR Workshop--Image and Information Systems: Applications and Opportunities - Washington, DC (Wednesday 12 October 1994)] 23rd AIPR Workshop: Image and Information Systems: Applications and Opportunities - Testing scanners for the quality of output images
Concepcion, Vicente P., Nadel, Lawrence D., D'Amato, Donald P., Costianes, Peter J.Volume:
2368
Year:
1995
Language:
english
DOI:
10.1117/12.200798
File:
PDF, 433 KB
english, 1995