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SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 15 April 2013)] Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III - Single and multi-channel Al-based multilayer systems for space applications in EUV range
Meltchakov, E., De Rossi, S., Mercier, R., Varniere, F., Jérome, A., Auchere, F., Zhang, X., Roulliay, M., Delmotte, F., Juha, Libor, Bajt, Saša, London, Richard, Hudec, René, Pina, LadislavVolume:
8777
Year:
2013
Language:
english
DOI:
10.1117/12.2017058
File:
PDF, 317 KB
english, 2013