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SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science & Technology - San Jose, CA (Sunday 5 February 1995)] Machine Vision Applications in Industrial Inspection III - Automated inspection system for detecting metal surface cracks from fluorescent penetrant images
Tang, Yonghong, Niu, Aiqun, Wee, William G., Han, Chia Y., Wu, Frederick Y., Wilson, Stephen S.Volume:
2423
Year:
1995
Language:
english
DOI:
10.1117/12.205514
File:
PDF, 1.11 MB
english, 1995