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SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - The assessment of industrial CT's probing error
Han, Sen, Yoshizawa, Toru, Zhang, Song, Shi, Yushu, Gao, Sitian, Song, Xu, Li, Dongsheng, Li, Wei, Li, Qi, Li, Shi, Chen, SiwenVolume:
9276
Year:
2014
Language:
english
DOI:
10.1117/12.2071795
File:
PDF, 1.13 MB
english, 2014