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SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] X-Ray and Extreme Ultraviolet Optics - Schwarzschild microscope at the wavelength of 18 nm using a laser-produced plasma source
Wang, Zhanshan, Cao, Jianlin, Chen, Bo, Ma, Yueying, Zhang, Junping, Chen, Xingdan, Hoover, Richard B., Walker, Jr., Arthur B. C.Volume:
2515
Year:
1995
Language:
english
DOI:
10.1117/12.212619
File:
PDF, 232 KB
english, 1995