SPIE Proceedings [SPIE Photonics China '96 - Beijing, China (Monday 4 November 1996)] Automated Optical Inspection for Industry - Study on an optoelectronic type of electric-current transducer system: for measuring primary electric current in a power system
Li, Fuying, Liang, Xiaochun, Dai, Xianwei, Kong, Lingxue, Wang, Zhonghua, Wang, Changyin, Wu, Frederick Y., Ye, ShenghuaVolume:
2899
Year:
1996
Language:
english
DOI:
10.1117/12.253017
File:
PDF, 421 KB
english, 1996