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SPIE Proceedings [SPIE Photonics China '96 - Beijing, China (Monday 4 November 1996)] Automated Optical Inspection for Industry - New method for measuring the properties of optical systems with micro-optic components
Tian, Weijian, Yang, Jianwen, Bao, Zhengkang, Zhang, Hedong, Chen, Bo, Guo, Lurong, Wu, Frederick Y., Ye, ShenghuaVolume:
2899
Year:
1996
Language:
english
DOI:
10.1117/12.253050
File:
PDF, 227 KB
english, 1996