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SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Optical System Contamination V, and Stray Light and System Optimization - Stray light analysis of the Lyman FUSE fine error sensor
Mehalick, Kimberly I., Morbey, Christopher L., Glassford, A. Peter M., Breault, Robert P., Pompea, Stephen M.Volume:
2864
Year:
1996
Language:
english
DOI:
10.1117/12.258325
File:
PDF, 418 KB
english, 1996