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SPIE Proceedings [SPIE Electronic Imaging '97 - San Jose, CA (Saturday 8 February 1997)] Machine Vision Applications in Industrial Inspection V - Efficient image-processing method in 3D vision inspection
Zhou, Huicheng, Chen, Jihong, Daoshan, Yang, Buckley, Shawn, Rao, A. Ravishankar, Chang, Ning S.Volume:
3029
Year:
1997
Language:
english
DOI:
10.1117/12.271239
File:
PDF, 616 KB
english, 1997