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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Rough Surface Scattering and Contamination - Sticky quartz crystal microbalance as a particle monitor

Uy, O. Manuel, Cain, Russell P., Carkhuff, Bliss G., Lennon, Andrew M., Chen, Philip T. C., Gu, Zu-Han, Maradudin, Alexei A.
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Volume:
3784
Year:
1999
Language:
english
DOI:
10.1117/12.366690
File:
PDF, 1.08 MB
english, 1999
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