SPIE Proceedings [SPIE Fourth International Workshop on...

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SPIE Proceedings [SPIE Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering - St. Petersburg, Russia (Monday 12 June 2000)] Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering - Evaluation of carbon surface diffusion on silicon by using surface phase transitions

Scharmann, F., Maslarski, P., Lehmkuhl, D., Stauden, Th., Pezoldt, Joerg, Melker, Alexander I.
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Volume:
4348
Year:
2001
DOI:
10.1117/12.417645
File:
PDF, 354 KB
2001
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