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SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design - Features of the subjective speckle field and their use for noise-immune unwrapping
Falldorf, Claas, Osten, Wolfgang, Elandaloussi, Frank, Kolenovic, Ervin, Jueptner, Werner P. O., Osten, Wolfgang, Jueptner, Werner P. O., Kujawinska, MalgorzataVolume:
4398
Year:
2001
Language:
english
DOI:
10.1117/12.445558
File:
PDF, 336 KB
english, 2001