SPIE Proceedings [SPIE Symposium on Integrated Optoelectronic Devices - San Jose, CA (Friday 18 January 2002)] Test and Measurement Applications of Optoelectronic Devices - Mixing of two 155-um laser waves in millimeter frequency range for optical components test
Dherbecourt, Pascal, Latry, Olivier, Joubert, Eric, Ketata, Mohamed, Chin, Aland K., Dutta, Niloy K., Herrick, Robert W., Linden, Kurt J., McGraw, Daniel J.Volume:
4648
Year:
2002
Language:
english
DOI:
10.1117/12.462661
File:
PDF, 738 KB
english, 2002