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SPIE Proceedings [SPIE Photonics Asia 2002 - Shanghai, China (Monday 14 October 2002)] Advanced Materials and Devices for Sensing and Imaging - Quantitative phase measurement interference microscope for transparent objects
Chen, Jun, Endo, Junji, Fujita, Hiroyuki, Yao, Jianquan, Ishii, YukihiroVolume:
4919
Year:
2002
Language:
english
DOI:
10.1117/12.465754
File:
PDF, 174 KB
english, 2002