SPIE Proceedings [SPIE SPIE's 27th Annual International...

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SPIE Proceedings [SPIE SPIE's 27th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 3 March 2002)] Emerging Lithographic Technologies VI - Ion beam sputter deposition of low-defect EUV mask blanks on 6-in. LTEM substrates in a real production environment

Becker, Hans W., Aschke, Lutz, Schubert, Birgit, Krieger, Juergen, Lenzen, Frank, Yulin, Sergey A., Feigl, Torsten, Kuhlmann, Thomas, Kaiser, Norbert, Engelstad, Roxann L.
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Volume:
4688
Year:
2002
Language:
english
DOI:
10.1117/12.472326
File:
PDF, 1008 KB
english, 2002
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