SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Scattered ultrasound fields measured by scanning laser vibrometry
Olsson, Erik, Molin, Nils-Erik, Sjodahl, Mikael, Zipser, Lothar, Franke, Heinz, Osten, Wolfgang, Kujawinska, Malgorzata, Creath, KatherineVolume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.500398
File:
PDF, 2.04 MB
english, 2003