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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Hard X-Ray and Gamma-Ray Detector Physics V - A safety inspection system for airfields based on x-ray technology
Jiao, Jianbing, Zhang, Junjie, Chang, Benkang, Fu, Rongguo, Gao, Qiang, Franks, Larry A., Burger, Arnold, James, Ralph B., Hink, Paul L.Volume:
5198
Year:
2004
Language:
english
DOI:
10.1117/12.504722
File:
PDF, 213 KB
english, 2004