SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] MEMS, MOEMS, and Micromachining - Real-time monitoring of thickness of silicon membrane during wet etching using a novel surface acoustic wave sensor
Lee, Chi-Yuan, Urey, Hakan, El-Fatatry, Ayman, Wu, Tsung-Tsong, Chen, Yung-Yu, Cheng, Ying-Chou, Chen, Wen-Jong, Pao, Shih-Yung, Chang, Pei-Zen, Chen, Ping-Hei, Yen, Kai-Hsiang, Xiao, Fu-YuanVolume:
5455
Year:
2004
Language:
english
DOI:
10.1117/12.544959
File:
PDF, 345 KB
english, 2004