SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Two methods to determine topological charge in regular net of optical vortices
Fraczek, Ewa, Ottevaere, Heidi, DeWolf, Peter, Fraczek, Wojciech, Wiersma, Diederik S.Volume:
5858
Year:
2005
Language:
english
DOI:
10.1117/12.612251
File:
PDF, 1.08 MB
english, 2005