SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2007 - San Jose, CA (Saturday 20 January 2007)] Ultrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV - Optical and x-ray characterization of two novel CMOS image sensors
Bohndiek, Sarah E., Tsen, Kong-Thon, Song, Jin-Joo, Arvanitis, Costas D., Venanzi, Cristian, Cohen, Marshall J., Glesener, John W., Royle, Gary J., Clark, Andy T., Crooks, Jamie P., Prydderch, Mark L.Volume:
6471
Year:
2007
Language:
english
DOI:
10.1117/12.700581
File:
PDF, 777 KB
english, 2007