SPIE Proceedings [SPIE Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation - Beijing, China (Friday 13 October 2006)] Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation - TPS verification with UUT simulation
Wang, Guohua, Fang, Jiancheng, Wang, Zhongyu, Meng, Xiaofeng, Zhao, RuixianVolume:
6358
Year:
2006
Language:
english
DOI:
10.1117/12.718271
File:
PDF, 179 KB
english, 2006