SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and testing technologies: Optical test and Measurement Technology and Equipment - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Testing smooth surface characteristics based on thermal infrared polarization
Sun, Li, Pan, Junhua, Wyant, James C., Wang, Zhen, Hong, Jin, Wang, Hexin, Qiao, Yan-li, Chen, Yi-qiongVolume:
6723
Year:
2007
Language:
english
DOI:
10.1117/12.783517
File:
PDF, 437 KB
english, 2007