SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007 - Beijing, China (Sunday 9 September 2007)] International Symposium on Photoelectronic Detection and Imaging 2007: Laser, Ultraviolet, and Terahertz Technology - Improved cutback method measuring beat-length for high-birefringence optical fiber by fitting data of photoelectric signal
Shi, Zhi-Dong, Lin, Jian-Qiang, Bao, Huan-Huan, Liu, Shu, Xiang, Xue-Nong, Zhou, LiweiVolume:
6622
Year:
2008
Language:
english
DOI:
10.1117/12.790822
File:
PDF, 467 KB
english, 2008