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SPIE Proceedings [SPIE Scanning Microscopy 2010 - Monterey, California (Monday 17 May 2010)] Scanning Microscopy 2010 - NEW scanning electron microscope magnification calibration reference material (RM) 8820
Postek, Michael T., Postek, Michael T., Newbury, Dale E., Vladár, András E., Keery, William, Platek, S. Frank, Joy, David C., Bishop, Michael, Bunday, Benjamin, Allgair, JohnVolume:
7729
Year:
2010
Language:
english
DOI:
10.1117/12.859118
File:
PDF, 3.58 MB
english, 2010