SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Antireflective gradient index silica films for high power laser applications
Yan, Lianghong, Yang, Li, Namba, Yoshiharu, Lv, Haibing, He, Shaobo, Walker, David D., Li, Shengyi, Yuan, Xiaodong, Zheng, WanguoVolume:
7655
Year:
2010
Language:
english
DOI:
10.1117/12.867596
File:
PDF, 343 KB
english, 2010