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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - High speed fringe projection for fast 3D inspection
Caspar, Sandra, Lehmann, Peter H., Osten, Wolfgang, Honegger, Marc, Rinner, Stefan, Gastinger, Kay, Lambelet, Patrick, Bach, Carlo, Ettemeyer, AndreasVolume:
8082
Year:
2011
Language:
english
DOI:
10.1117/12.888930
File:
PDF, 7.09 MB
english, 2011