SPIE Proceedings [SPIE SPIE MOEMS-MEMS - San Francisco,...

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SPIE Proceedings [SPIE SPIE MOEMS-MEMS - San Francisco, California, USA (Saturday 21 January 2012)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI - Evaluation of surface control and durability CNT and ITO coated PET transparent electrode under different dry conditions

Park, Joung-Man, Kwon, Dong-Jun, Wang, Zuo-Jia, Gu, Ga-Young, DeVries, Lawrence, García-Blanco, Sonia M., Ramesham, Rajeshuni
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Volume:
8250
Year:
2012
Language:
english
DOI:
10.1117/12.904118
File:
PDF, 2.35 MB
english, 2012
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