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SPIE Proceedings [SPIE 1986 International Symposium/Innsbruck - Innsbruck, Austria (Tuesday 15 April 1986)] Thin Film Technologies II - Measurement Of Scattering Distribution For Characterization Of The Roughness Of Coated Or Uncoated Substrates
Roche, F, Amra, C, Pelletier, E, Jacobsson, J. RolandVolume:
652
Year:
1986
Language:
english
DOI:
10.1117/12.938388
File:
PDF, 260 KB
english, 1986